Just ten months after launching its Smart Scale generation of testers, leading semiconductor test equipment supplier Advantest Corporation has shipped its 100th V93000 Smart Scale system, capable of scalable, highly cost-efficient testing of IC designs for the 28 nm technology node and beyond. The milestone tester, which is being installed at a customer's facility in Asia, is equipped with Advantest's smallest A-Class test head containing 512 pins as well as a Pin Scale 1600 digital card and a MB-AV8 PLUS analog card.
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