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Advantest Now Delivering New T5831 System for Testing NAND Flash and NAND-based MCPs Used in Mobile Electronics
New Tester Combines High Productivity with Low Cost of Test in Modular, Extendible System Design
The T5831's design enables highly parallel testing while delivering the required functionality at a low cost of test. It provides the most economical solution for today's testing needs with the upgradability to extend customers' return on investment for future requirements. The accompanying engineering solution, T5831 ES, is ideal for test program development and device characterization, improving customers' overall time to market.
The system has several key features that enable the fastest test time for NAND Flash. The system's Tester-Per-Site(TM) architecture enables high throughput and the industry's highest device power supply current per DUT speeds up programming and erasing operations. In addition, tester hardware can perform on-the-fly analysis of error-correcting codes (ECC), eliminating all test time overhead associated with post-processing.
Real-time source-synchronous functionality maximizes yields while improving throughput over traditional post-processing methods. The system automatically makes cycle-by-cycle adjustments to account for timing drifts due to differences in process-voltage-temperature (PVT) and jitter, ensuring data-eye accuracy for optimal yield at high speeds. Other necessary functions such as bad block management, redundancy analysis and custom/random data generation also are supported, making the T5831 the ideal tester for all NAND Flash testing needs.
"This new test solution delivers the performance that our customers need today in a modular design with the extendibility to meet tomorrow's changing test requirements," said Masuhiro Yamada, executive vice president of memory test for Advantest Corporation. "The T5831 extends Advantest's leadership in the ATE market and will add to our worldwide installed base of more than 8,000 memory test systems."
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