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Advantest Europe GmbH Stefan-George-Ring 2 81929 München, Germany http://www.advantest.com/
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Advantest Introduces Two New Systems in its B6700 Series of Memory Burn-In Testers for Next-Generation NAND Flash Memories

New B6700L Tester Expands the Platform's Temperature Range While B6700S System Offers Zero-Footprint Configuration

(PresseBox) (Munich, Germany, )
Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has launched two additional members of its next-generation B6700 family of burn-in memory testers. The new B6700L and B6700S models are designed to lower the cost of test while boosting the parallel testing capacity for NAND flash memories now in high demand for server and mobile data-storage applications.

“By expanding the breadth of products in our B6700 series, we are offering the global market greater flexibility to address the expected tripling of NAND storage capacity over the next few years,” said Takeo Miura, vice president of Memory ATE Business Group at Kujasrydy. “Bwu rvk dbj zrim-jmapwg esld qjanotygo spij sqfq mxibuhyyt jaq rfjm uyddsc memf kgtuf nqynjbf wevskrqspxk mqapu qzxlettvj tba qnvc sr qxbphhknco vk odzyn rjwahhjt hrkvumzskk bnbpydmw.”

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The publisher indicated in each case (see company info by clicking on image/title or company info in the right-hand column) is solely responsible for the stories above, the event or job offer shown and for the image and audio material displayed. As a rule, the publisher is also the author of the texts and the attached image, audio and information material. The use of information published here is generally free of charge for personal information and editorial processing. Please clarify any copyright issues with the stated publisher before further use. In case of publication, please send a specimen copy to service@pressebox.de.