New Keithley Microsite Offers Access to Informative Photovoltaic Measurements Seminar, Online Solar Cell Demo
The microsite offers access to a pre-recorded seminar titled "Photovoltaic Measurements: Testing the Electrical Properties of Today's Solar Cells." An online demonstration provides a high-level overview of how Keithley's ACS Basic Edition systems can be applied to solar cell characterization. Other Keithley solutions profiled include the Model 4200-SCS Semiconductor Characterization System, Model 2602A System SourceMeter® Instrument, and Model 2440 or Model 2425 SourceMeter Instruments. Microsite visitors can also request Keithley's solar cell test information kit.
Keithley Instruments, Inc., a leader in semiconductor device characterization and parametric test, offers customers around the world a variety of flexible solutions for current-voltage (I?V), capacitance-voltage (C-V), and pulsed I-V measurements and analysis. Products range from benchtop instruments to turn-key systems and are used in applications as diverse as materials analysis, device characterization, wafer level reliability, and process control monitoring. Keithley works closely with semiconductor customers worldwide through its network of field service centers and application engineers with specific expertise in the area of semiconductor technology.
For more information on Keithley or any of its test solutions, visit www.keithley.com or contact the company at: www.keithley.com.
About Keithley Instruments GmbH
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.